Of the super-resolution techniques SIM and rescan are the techniques with the lowest demands on sample preparation, although optimalisation will also improve this techniques. Normal fluorescent slides can be used, but high quality coverslips (0.170 +/- 0.005 um) are advised.
SIM is a widefield technique based on the distortion of the normal light by projecting a 3D line pattern on the sample. The pattern is shifted resulting in 5 different phases and is rotated in 3 or 5 angles. From these images the high resolution component is reconstructed resulting in a two times higher resolution in X, Y and Z, meaning 8 times smaller volumes.